abstract: application of atomic force microscope as a manipulator for pushing-based positioning of nano-particles has been of considerable interest during recent years. however a detailed modeling of the interaction forces and control on the afm tip is important for prosperous manipulation control, a reliable control of the afm tip position during the afm-based manipulation process is a main is...

Avoiding collision of nano-particles during manipulation operations and selecting the best route and lowest Atomic Force Microscopy (AFM) movement are major concerns in the area of nano-space. To apply the lowest force on the cantilever from fluid environment forces, we try to minimize AFM movements. Our proposed method calculates the optimum routing for AFM probe movement for nano-particles tr...

In the last two decades, nano manipulation has been recognized as a potential tool of scientific interest especially in nanotechnology and nano-robotics. Contemporary optical microscopy (super resolution) techniques have also reached the nanometer scale resolution to visualize this and hence a combination of super resolution aided nano manipulation ineluctably gives a new perspective to the sce...

according to recent achievements in nano technology we can see its effects in different engineering fields. in nano manufacture process the first essential step is modeling coordinately in order to make it available different software are developing for this propose.  in this paper nano modeling for two papers is developed first understanding structure in nano and micro size and second simulati...

Current advancements in nanotechnology are dependent on the capabilities that can enable nano-scientists to extend their eyes and hands into the nano-world. For this purpose, a haptics (devices capable of recreating tactile or force sensations) based system for AFM (Atomic Force Microscope) is proposed. The system enables the nano-scientists to touch and feel the sample surfaces, viewed through...

This study demonstrates the advantages of the combination between atomic force microscopy and scanning electrochemical microscopy. The combined technique can perform nano-electrochemical measurements onto agarose surface and nano-electrografting of non-conducting polymers onto conducting surfaces. This work was achieved by manufacturing an original Atomic Force Microscopy-Scanning ElectroChemic...

Nanoscale entities are by definition invisible to the unmediated senses. Yet generating images of these objects has been crucial to the rhetoric of nanotech boosters. Thus, bringing microscopes and microscopists under the nano umbrella has been central to the work of nano proponents. No instruments have been more crucial to this process than the scanning tunneling microscope (STM) and atomic fo...

Dimensional measurements on nano-objects by atomic force microscopy (AFM) require samples of safely fixed and well individualized particles with a suitable surface-specific particle number on flat and clean substrates. Several known and proven particle preparation methods, i.e., membrane filtration, drying, rinsing, dip coating as well as electrostatic and thermal precipitation, were performed ...

In-addition to the applications of imaging and characterization, proximal probes are proposed to be used as three-dimensional (3-D) nano-scale manufacturing tools in this paper. Commercially available Atomic Force Microscope (AFM) systems are mainly limited to 1-D or 2-D manipulation tasks, and advanced 3-D nano-manufacturing applications are not possible. Therefore, this paper proposes 3-D nan...

Using Atomic Force Microscopes (AFM) to manipulate nano-objects is an actual challenge for both physicians and biologists. Many visual and haptic interfaces between the AFM and experimentalists have already been implemented. The multi-sensory renderings (seeing, hearing, feeling) studied from a cognitive point of view increase the efficiency of the actual interfaces and represent our challenge....